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Scanning Electron Microscopy (SEM) and Focused Ion Beams (FIB) in Materials Research.View Scanning Electron Microscopy Research Papers on Academia.edu for free. Log In; Sign Up; Scanning Electron Microscopy. 5,919 Followers. Papers; People.SPECIMEN PREPARATION for SCANNING ELECTRON MICROSCOPY1 Building and Fire Research Laboratory National Institute of 400 and 600 (silicon carbide paper).1 © 2012 University of Illinois Board of Trustees. All rights reserved. Scanning Electron Microscopy (SEM) and Focused Ion Beams (FIB) in Materials Research.HaemoScan Blood Activation Research Scanning Electron Microscopy. Scanning Electron Microscopy. Figure 1. No additional co-authors on your paper.An electron microscope is a microscope that uses a beam of accelerated electrons as a source The SEM produces images by probing the specimen with a focused electron beam that is scanned across.(for example confocal laser scanning microscopy and scanning electron microscopy). 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